On Demand Webinar: A technology breakthrough: why CMOS-based detectors are changing the way we use EBSD
On Demand Webinar: A technology breakthrough: why CMOS-based detectors are changing the way we use EBSD
Now Available On-Demand
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Following its launch in early 2017, the Oxford Instruments Symmetry® EBSD detector has made a significant impact in the microanalysis community. Built on many years of in-house research, Symmetry was the first commercial EBSD detector to utilise a complementary metal oxide semiconductor, enabling a dramatic increase in data acquisition speeds (well in excess of 3000 patterns per second) with no compromise to data quality. In this webinar, we shall be introducing the Oxford Instruments CMOS-based EBSD detector range and discussing the technological benefits of CMOS sensors compared to traditional charge coupled device (CCD) devices. In particular, we shall look at ways in which the CMOS performance advantage is ushering in new applications of EBSD, as well as revolutionising existing materials research fields.
Speakers:
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Jenny Goulden, |
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Pat Trimby, |
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Mike Hjelmstad, |
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Introducing the X-MaxN Range of Silicon Drift Detector Innovations in SDD Technology
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New ways of exploring the Nano-world
October 7, 2009
Find out how to improve data collection times and make fast mapping in TEM and STEM a reality - all without liquid nitrogen...
Oxford Instruments
Oxford Instruments provides leading-edge tools that enable materials characterisation (EDS, WDS and EBSD) and sample manipulation at the nanometre scale.