Exploring flatland: AFM of mechanical and electrical properties of graphene, MoS2 and other low-dimensional materials
Low-dimensional materials such as graphene are composed of a single layer or at most a few layers of atoms. To resolve the structure of these materials requires an instrument with sub-Ångstrom resolution – a regime where the atomic force microscope (AFM) excels. Going beyond simple topography measurements, there are a host of mechanical and electrical characterization techniques that rely on the AFM cantilever being able to literally “feel” the mechanical and electrical properties of the material. In this paper, we describe several new and existing applications where AFM is used to probe the mechanical and electrical properties of these rapidly emerging materials.
Microscopy and Analysis 27(3) April 2013
Download article: http://www.microscopy-analysis.com/sites/default/files/2013_April_Bertolazzi.pdf
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