Took place on Wednesday October 25, 2017

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During the first part of this webinar, Dr. Wolfgang Grünewald will demonstrate how the unique combination of pre-preparation system and ion milling system makes fast site specific sample preparation for Scanning Electron Microscopy or optical microscopy possible.

You will discover how keeping the sample in the same holder and observing the sample during the full preparation process will dramatically improve your sample preparation lead time.

In the second part of the webinar, Imène Esteve, expert in sample preparation for SEM at IMPMC, Paris, will explain why sample preparation choice is crucial for sample analysis and will describe further ion beam milling application illustrations.

Who would find this webinar informative:

• SEM users
• Engineers and researchers from companies and academics working with material samples such as polymers, multi-layers samples, electronics, stones, etc
• Material scientists already working with Ion Beam Milling

Speakers:

Dr. Wolfgang Grünewald, Applications Scientist, Leica Microsystems Dr. Wolfgang Grünewald studied Physics from 1975 to 1980. In his diploma and dissertation at the Institute of Physics Technical University of Chemnitz, he dealt with TEM investigation of thin films and ion milling as an appropriate sample preparation method. Since 2008, he has worked as a worldwide Application Specialist at Leica Microsystems for solid states. He has been responsible for 5 patent submissions and wrote several publications.

Imène Esteve, Engineer, CNRS/IMPMC Imène Esteve is an engineer at the Centre National de Recherches Scientifiques (CNRS). She is an expert in electron microscopy, particularly in Focused Ion Beam (FIB) and Scanning Electron Microscopy at the Institut de Minéralogie et Physique des Matériaux et de Cosmochimie (IMPMC) in Paris, where she is the head of the SEM-FIB national facility. She obtained her master degree in physics and chemistry of semi conductive materials from Versailles University (UVSQ) in 2006. She has worked as a microscopist at Michelin’s Research Center at Clermont-Ferrand, and as an application engineer for FIB and SEM for the Zeiss Company. She is involved in several projects in mineralogical, biological, geophysical fields, such as the study of meteorites, nuclear wastes storage solutions and materials under extreme conditions. Recently she started a collaboration with the JPL-NASA on the SEIS InSight mission to MARS 2018.

 

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