ZEISS introduces next generation X-ray microscopes

Editorial
Monday, February 4, 2019 - 14:00
Image: ZEISS Xradia 620 Versa enables fast sub-micron imaging of intact samples at high resolution. 
 
ZEISS has introduced two new models of the ZEISS Xradia Versa family.
 
The ZEISS Xradia 610 & 620 Versa X-ray microscopes promise faster non-destructive imaging of intact samples without sacrificing resolution and contrast over the full range of power and kV.
 
The instruments provide 'Resolution at a Distance' (RaaD), which is said to ensure that the highest resolution is maintained across longer working distances.
 
The two biggest challenges in X-ray computed tomography are maintaining resolution on large sample sizes even at long working distances while simultaneously maximizing resolution and X-ray flux for greater throughput.
 
According to ZEISS, both instruments address these challenges; they provide a high-power X-ray source for significantly higher X-ray flux.
 
This leads to faster tomography scans and therefore up to two times higher throughput, without compromising spatial resolution. 
 
The company believes that academic shared-use facilities as well as industrial customers will derive maximum value from the faster image acquisition of these instruments.
 
The ZEISS Xradia 600-series Versa provides insights into the morphology of energy materials and their behaviour under operating conditions.
 
RaaD technology allows intact battery cells to be imaged at high resolution, enabling longitudinal studies of aging effects, across hundreds of charge cycles.
 
In electronics and semiconductor industries, users typically perform structural and failure analysis for process development, yield improvement and construction analysis of advanced semiconductor packages. 
 
In the additive manufacturing industry, typical X-ray microscopy applications include studying detailed shape, size, and volume distribution of particles in powder beds to determine appropriate process parameters, as well as surface roughness analysis of inner structures that cannot be accessed by other methods.
 
In the raw materials industry, the new ZEISS Xradia Versa X-ray microscopes promise to provide the most accurate 3D nanoscale support for digital rock simulations, laboratory-based diffraction contrast tomography (LabDCT), and multiscale imaging at faster run times.
 
In life sciences, the ZEISS Xradia 600-series Versa are said to enable faster and higher resolution imaging allowing researchers to study soft tissue such as neural tissue, vascular networks, cellular structures, ligaments, nerves; mineralized tissue such as bones; and plant structures such as roots and cellular structures.
 
ZEISS X-ray microscopes are designed to be upgradeable and extendible with future innovations and developments.
 
From ZEISS Xradia Context microCT, to ZEISS Xradia 500/510/520 Versa, and now with the addition of ZEISS Xradia 610/620 Versa, users can field-convert their systems to the latest X-ray microscopes.
 
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