World's first CMOS EBSD detector launched

Tuesday, May 16, 2017 - 10:45
Image: Inverse pole figure orientation map of a martensitic sample acquired at 294 pps with 97% indexing using a 40 nm step size [Oxford Instruments]
Oxford Instruments has launched Symmetry, described as the world’s first CMOS-based electron backscatter diffraction (EBSD) detector.
According to the company, Symmetry represents a significant breakthrough compared to conventional CCD-based detectors.
The instrument's acquisition speed is in excess of 3000 indexed patterns per second (pps).
Symmetry also promises uncompromising sensitivity and data quality, providing up to an order of magnitude performance improvement on all samples.
The step change in performance is enabled by optimised CMOS technology and optics.
Even on challenging materials which previously required sensitive and relatively slow CCD cameras (below 100pps), Symmetry routinely achieves speeds in excess of 1000 pps.
As Dr Christian Lang, Oxford Instruments Nanoanalysis Marking Director, says: "EBSD has become a vital tool for materials characterisation in this nanotechnology age, yet has been limited by relatively long acquisition times."
"Symmetry changes everything: the sensitivity and speed of CMOS image sensors, already established in the astronomy and bio-medical sectors, enable full materials characterisation in minutes,” he adds.
Dr Patrick Trimby, EBSD Product Manager at Oxford Instruments believes the release of Symmetry will change the future of microanalysis.
“In my opinion, the age of the CCD detector in EBSD is over. Symmetry is a revolutionary development. The fact that we can collect and index low noise, high resolution diffraction patterns in sub-millisecond timeframes will open up a host of new application fields such as in situ experiments and the study of bio- and nanocrystalline materials," he says. "The significant improvement in performance across all conditions means that this detector is suitable for all types of EBSD work.”
Learn more here.
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