Thermo Fisher Scientific delivers Spectra S/TEM

Editorial

Rebecca Pool

Monday, August 5, 2019 - 19:30
Thermo Fisher Scientific has unveiled the Thermo Scientific Spectra scanning/transmission electron microscope designed to accelerate breakthrough discoveries by delivering advanced atomic-scale imaging and analysis, all in one tool.
 
According to the company, Spectra combines the highest commercially available image resolution specification with the highest sensitivity, and allows users of all experience levels to generate best-in-class results.
 
Spectra targets researchers in academic or industrial labs who need to characterize a wide variety of materials at the atomic level.
 
The new STEM is set to help researchers create lightweight materials such as advanced steels, aluminium alloys or plastics used to develop safer or more fuel-efficient transportation.
 
Thermo Scientific Spectra scanning/transmission electron microscope (S/TEM)
 
For engineers studying new structures and materials for semiconductor devices, the instrument also promises to enable the design of higher capacity and faster generations of smart phones and other electronic devices.
 
“Spectra [delivers] the best atomic-level imaging and analysis in a single tool,” highlights Mike Shafer, president of materials and structural analysis at Thermo Fisher Scientific.
 
“Spectra offers unprecedented ease-of-use for the widest range of applications while solving some of today’s most challenging problems including the analysis of beam-sensitive materials, shrinking devices, and increasingly complex materials structures,” he adds.
 
The new STEM is said to include revolutionary detection capabilities, allowing scientists and engineers to acquire previously unobtainable atomic-level data for a wider range of applications.
 
The platform makes it possible to obtain detailed images of extremely beam-sensitive materials and semiconductor structures such as metal organic frameworks, zeolites, and polymers that can be damaged or destroyed if exposed to the electron beam for too long or at the wrong voltage.
 
It also meets the growing demand for high-volumes of atomic-level chemical analysis using several modalities such as EDX (Energy Dispersive X-Ray) or EELS (Electron Energy Loss Spectroscopy).
 
New features include a higher-brightness electron source; the STEM includes a bright cold field emission gun (X-CFEG) for higher contrast imaging.
 
Meanwhile, for chemical analysis and x-ray analytics, the X-CEFG provides more than twice the signal and greater than ten percent higher spatial resolution than conventional CFEG sources found in mainstream TEMs.
 
Spectra also includes a new X-FEG/Ultimono source that allows researchers and engineers to generate complex high energy resolution data as an additional capability rather than having to dedicate a tool for that single purpose.
 
This can help accelerate new materials development because researchers will better understand the electrical behaviour parallel to other critical properties.
 
The instrument also features an Electron Microscope Pixel Array Detector (EMPAD), a high-speed pixelated STEM detector that allows researchers to perform a large number of advanced applications such as Ptychography for super-high resolution and user segmentation of signals.
 
 
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