Bruker launches Dimension XR SPMs

Editorial
Thursday, December 6, 2018 - 11:00
 
According to the company, the new systems incorporate major AFM innovations, including DataCube nanoelectrical modes, AFM-SECM for energy research, and the new AFM-nDMA mode, which for the first time correlates polymer nanomechanics to bulk dynamic mechanical analysis (DMA).
 
Building on the Icon and FastScan AFM platforms, Dimension XR SPMs are available in three configurations optimised for nanomechanics, nanoelectrical, and nanoelectrochemical applications.
 
These systems expand researchers’ ability to quantify material properties at the nanoscale in air, fluids, electrical, and chemically reactive environments.
 
The new Bruker systems incorporate major AFM innovations.
 
“The new Dimension XR systems are the culmination of years of innovations to provide quantitative and easy-to-use nanomechanical, nanoelectrical, and nanoelectrochemical characterization,” explains David V. Rossi, Executive Vice President and General Manager of Bruker’s AFM business. “Our goal is to make these first and only capabilities widely available to the research community, enabling their breakthrough AFM discoveries with new nanoscale information.”
 
The Dimension XR Nanomechanics configuration combines AFM-nDMA, PeakForce QNM, FASTForce Volume, and FASTForce Volume CR modes to rapidly and quantitatively characterize materials for their nanomechanical characteristics.
 
Meanwhile, the Dimension XR Nanoelectrical configuration includes PeakForce TUNA, PeakForce KPFM and DataCube modes for the most complete array of electrical AFM techniques on a single system, claims the company.
 
The Dimension XR NanoEC configuration uses Bruker's nanoelectrode probes with EC-AFM and PeakForce SECM modes to perform in-situ topography scans in the electrochemical environment, providing a turnkey solution for real-time quantitative analysis of nanoscale local reactivity.
 

 

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