Bruker introduces AFM-Based nano-DMA
Bruker has released the AFM-nDMA mode for Dimension atomic force microscopes (AFMs).
Going beyond the quantitative elastic modulus mapping enabled by PeakForce QNM mode, AFM-nDMA provides nanoscale viscoelastic measurements that match bulk dynamic mechanical analysis (DMA) over the entire frequency range typical in bulk rheological measurements.
Enabled by proprietary algorithms, the new mode works directly at rheological frequencies, quantifies preload and adhesion, and comes with absolute calibration.
As a result, it generates entire master curves of storage modulus, loss modulus, and loss tangent, including analysis for activation energy, thus vastly expanding the AFM market by providing polymer rheology at the nanoscale.
“Bruker’s AFM-nDMA is [used]... to quantify viscoelasticity at the spatial scales of AFM,” says Professor Ken Nakajima from Polymer Physics at Tokyo Institute of Technology. “Having pioneered nanoscale rheological measurements, I am very excited to see this important capability become widely available.”
“We can now quantify local viscoelasticity at relevant frequencies and length scales that relate nanoscale properties to bulk performance,” adds Dr Greg Meyers, Dow Chemical Core R&D Fellow. “This addresses a significant unmet need for industrial polymer characterisation.”
As the company highlights, the new AFM-nDMA mode includes proprietary algorithms, modular hardware, and precalibrated probes integrated into an efficient workflow to deliver quantitative nanoscale measurements of storage modulus, loss modulus, and loss tangent at rheological frequencies.
With frequencies from 0.1 Hz to 20 kHz, temperatures up to 250°C, and sample moduli in the sub-MPa to GPa range, AFM-nDMA provides broad coverage of polymer applications.
AFM-nDMA integrates with Bruker’s MIROView user interface and PeakForce QNM region-of-interest targeting, as well as with new multiscript analysis features for full master curve analyses.