EDAX Inc Webinar: EDS mapping: data collection, representation, extraction, and mining
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EDAX Inc Webinar: EDS mapping: data collection, representation, extraction, and mining
Wednesday, April 11, 2018 - 15:00 UTC
8am PDT | 11am EDT | 4pm BST (UK) | 5pm CEST
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With the advances in energy dispersive spectrometry (EDS) detectors, the technology has moved from single point-and-shoot spectrum collection to complete X-ray imaging. In times past the output of the data collection was simply an image but modern systems have a full spectrum associated with each individual pixel in the image. This allows us to do a significant amount of post processing of both the spectra and images to bring out the details, correlate elemental distributions, and locate small contributions not easily visible in the sum spectra.
In this webinar we will be taking a look at how different microscope settings affect map output and quality under high vacuum and variable pressure conditions and what information can be gained by varying these settings. Based on several examples, we will go through the various map types that can be calculated based on the raw data and discuss the difference between them. We will also cover some of the various options for extracting data from the maps in order to access information that is not obvious or accessible at first glance.
If you attend this webinar you will:
- Gain insight into the experimental parameters to consider when optimizing the SEM for EDS mapping.
- Learn about the strengths and weaknesses of the different ways of visualizing elemental distributions in a sample.
- Get the most out of your data collection by knowing the post-processing tools available.
Your Speaker:
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Dr. Jens Rafaelsen, Applications Engineer, EDAX Inc Jens Rafaelsen joined EDAX in 2014 as an Applications Engineer specializing in EDS. He has a strong background in electron microscopy and has trained numerous students and clients in SEM and EDS theory and practice. His experience includes several years as the technical supervisor of the clean room facilities at Aalborg University, Denmark, where he applied a variety of techniques including SEM, FIB, CVD, PVD, PES, AFM, laser spectroscopy, and optical, electron, and ion beam lithography. |
Solving Industrial Quality/Process Control and Failure Analysis Problems with Small Spot XRF
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When: This webinar was recorded and is now available on demand.
Click here to register or login here access the recording.
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When: This webinar was recorded and is now available on demand.
Click here to register or login here access the recording.
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When: This webinar was recorded and is now available on demand.
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When: This webinar was recorded and is now available on demand.
Click here to register or login here access the recording.
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When: This webinar was recorded and is now available on demand.
EDAX Inc
EDAX is the global leader in Energy Dispersive X-ray Microanalysis, Electron Backscatter Diffraction, and X-ray Fluorescence systems.