Blog

Anonymous (not verified) | 13 September, 2018
So I actually started my scanning probe microscopy career with ambient scanning tunneling microscopy (STM) in the basement of Columbia University’s Havemeyer Hall in George Flynn’...
Dalia Yablon Ph.D | 06 September, 2018
The end of August is when most people’s minds are focused on beaches, ice-cream, and movies.   But for over 16,000 chemists, the end of August was a time to converge on Boston for...
Dalia Yablon Ph.D | 02 May, 2018
When I first got into the field of trying to make quantitative nanomechanical measurements with AFM, I was trying to measure the storage modulus (a viscoelastic modulus – see my...
Dalia Yablon Ph.D | 09 April, 2018
One of the most frequent image analysis tasks that I am asked to do involves some kind of measurements on particles or pores:  counting them, sizing them, measuring their...
Dalia Yablon Ph.D | 16 January, 2018
A new year.  A new start.  It’s always an opportunity to assess where things stand and wipe the slate clean if necessary.  I have been thinking a lot about the state of...
Dalia Yablon Ph.D | 04 January, 2018
For the first 20 years or so, resonant AFM modes such as tapping modes - that take advantage of oscillating the cantilever at its resonance frequency - occurred at the frequency...
Dalia Yablon Ph.D | 13 December, 2017
It is hard to believe MRS was just last week and I was a bit sad for the week to end. It was quite the SPM reunion – people compared it to an old high school reunion with so many...
Dalia Yablon Ph.D | 16 November, 2017
A lot of AFM nanomechanical measurements are geared towards measuring modulus.  But what is modulus? There are so many different kinds:  Youngs modulus, elastic modulus, tensile...
Dalia Yablon Ph.D | 16 November, 2017
It’s time for the annual fall meeting of MRS, which always takes place in Boston at the Hynes Convention Center and adjacent Sheraton Hotel the week after Thanksgiving (November...
Dalia Yablon Ph.D | 08 October, 2017
Calibrations are an important parameter for all metrological instrumentation and measurements.  You need to have confidence in what you are measuring whether it’s the x and y...
Dalia Yablon Ph.D | 18 September, 2017
The jargon in the scanning probe world has become really confusing, especially as it is condensed mostly into 3-4 letter acronyms, where the final letter is usually “m” for...
Dalia Yablon Ph.D | 18 September, 2017
As summer draws to a close, the fall conference season swings into action.  A lot of people have asked me over the years, “what are the good AFM conferences”?  Either to learn...
Dalia Yablon Ph.D | 30 August, 2017
It still amazes me to hear how many AFM users are still missing many of the basics of AFM operation.  I interact heavily with users from a wide variety of backgrounds at...
Dalia Yablon Ph.D | 17 July, 2017
That seems to be a weighty question, especially for an SPM blog.  It is on my mind as I returned from the 2017 Techconnect meeting which was held at the Gaylord convention center...
Dalia Yablon Ph.D | 17 July, 2017
I attended the spring ACS meeting in San Francisco in April.  ACS is always chock-full of things to do between the technical program and exhibit.  This year, the spring meeting...
C Parmenter | 11 June, 2017
Ever since his 2009 Science publication, Leo Gross and his IBM Zurich colleagues have captured our imagination by imaging the pentacene molecule with AFM and revealing clearly its...
Dalia Yablon Ph.D | 19 May, 2017
I started this blog by calling it “AFM vs. instrumented nanoindenters.”  But I really didn’t like that title because I don’t like to pit these 2 methods against one another and I...
Dalia Yablon Ph.D | 03 May, 2017
I haven’t written much about nanoindentation yet.  The field itself is pretty confusing because of a lot of ‘AFMers’ who conduct force spectroscopy measurements call these...
Dalia Yablon Ph.D | 26 April, 2017
Hybrid or correlative microscopy methods are in vogue.  My last blog was about joining the complementary worlds of AFM and SEM, and I mentioned some other hybrid AFM methods...
Dalia Yablon Ph.D | 10 April, 2017
I have recently been hearing a lot about hybrid AFM-SEMs which are a fairly recent innovation with some commercial entries to market over the past 5 years.  So first, let’s...
Dalia Yablon Ph.D | 06 February, 2017
 
Dalia Yablon Ph.D | 02 February, 2017
The Materials Research Society (MRS) annual fall meeting in Boston was again a powerful showcase of technological capability and innovation in materials science with over 6,000...
C Parmenter | 17 January, 2017
In this week’s blog I am concluding my little two-part series about the cantilever. Why so much space and effort dedicated to the SPM cantilever?  Because too often I encounter...
Dalia Yablon Ph.D | 08 December, 2016
The heart of the AFM is really in the cantilever/tip assembly, often referred to as the probe.  This probe governs the interaction and ultimately the type and quality of data...
Dalia Yablon Ph.D | 04 October, 2016
User-friendliness seems to be a key feature in operating any high end instrumentation these days, including electron or scanning probe microscopes.   Whenever you check out a...
Dalia Yablon Ph.D | 01 September, 2016
Atomic force microscopy is celebrating its 30th birthday this year after its invention in 1986 by Gerd Binnig, Christoph Gerber, and Calvin Quate, who were scientists at the IBM...
C Parmenter | 31 July, 2015
With just a few days to go before M&M 2015 I thought that I’d give you a run-down of what you can expect from the conference and also its host city of Portland. No doubt as...
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